Electronic Device Failure Analysis
Impact Factor Trend
Clarivate IF trend for Electronic Device Failure Analysis
SCImago Journal Rank citation prestige weighting
7 papers with at least that number of citations each
Aims & Scope
Electronic Device Failure Analysis is a growing technical resource for the Failure Analysis engineer. Each quarterly issue covers: - Contributed technical articles that cover everything from operations to techniques - Insight into trends in the microelectronics FA industry, to keep you up-to-date - New product announcements - Recognition of outstanding contributions to the field of FA - Looking to update some skills? The Training Calendar provides an easy way to know what courses are coming up in the months ahead. - News of the Electronic Device Failure Analysis Society. - Guest Columns provide that vital perspective into other FA
Special Issues
Calls for PapersNo active Calls for Papers found for this journal.
WoS Categories & Quartiles
Detailed JCR / JCI category rankings and quartile breakdown from Clarivate
No WoS category details available for this journal.
Annual Historical Statistics & Publications
Track annual publication volume, total citations, and Impact Factor evolution
SCImago & Scopus Journal Intelligence
Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact
Weighted prestige citation metric per document indexed in the Scopus database.
Average citations received per document published in the 2-year window.
Estimated Article Processing Charge for Open Access publication.
Scopus 3-Year Publication & Citation Window
Aggregated from Scopus database across the 3-year SJR evaluation window.
Societal Impact & Inclusivity (SCImago)
Citations in government and international policy documents
Percentage of female authors published in the journal
Real-world societal policy reach and author gender diversity tracked by SCImago.
Scopus Subject Categories
Journal Metrics & Citation Visualizations
Total Cites vs Self-Cites
Evaluation of scholarly independence and citation reach
Citations per Document
Citation metric windows across 2, 3, and 4 years
Chinese Academy of Sciences (CAS) Classification
Major / minor zone classification and CAS Early Warning List history
Academic Intelligence Overview & Context
ImpaQ AnalysisElectronic Device Failure Analysis (ISSN: 1537-0755) is a peer-reviewed international scholarly journal in the field of Engineering, published by ASM International in United States. The periodical holds tracked under Web of Science (SCIE) in quartile Q1, a Scopus SJR indicator of 0.112 (Q4), an H-index of 7.
The journal enforces rigorous peer evaluation with an annual output of approximately 0 scientific articles. In terms of accessibility and author fees, it operates under the Subscription model with an estimated APC of $2,258 USD. It serves as a benchmark publication platform for academics, researchers, and doctoral candidates seeking global research visibility.
Publishing & Editorial Information
Detailed publisher, peer-review turnaround, and publication cycle specifications
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