IEEE Design & Test
Impact Factor Trend (2018–2026)
Clarivate IF trend for IEEE Design & Test
SCImago Journal Rank citation prestige weighting
89 papers with at least that number of citations each
Aims & Scope
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
Special Issues
Calls for PapersNo active Calls for Papers found for this journal.
WoS Categories & Quartiles
Detailed JCR / JCI category rankings and quartile breakdown from Clarivate
COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
ENGINEERING, ELECTRICAL & ELECTRONIC
COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
ENGINEERING, ELECTRICAL & ELECTRONIC
Annual Historical Statistics & Publications
Track annual publication volume, total citations, and Impact Factor evolution
SCImago & Scopus Journal Intelligence
Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact
Weighted prestige citation metric per document indexed in the Scopus database.
Average citations received per document published in the 2-year window.
Estimated Article Processing Charge for Open Access publication.
Scopus 3-Year Publication & Citation Window
Aggregated from Scopus database across the 3-year SJR evaluation window.
Societal Impact & Inclusivity (SCImago)
Citations in government and international policy documents
Percentage of female authors published in the journal
Real-world societal policy reach and author gender diversity tracked by SCImago.
Scopus Subject Categories
Journal Metrics & Citation Visualizations
Total Cites vs Self-Cites
Evaluation of scholarly independence and citation reach
Citations per Document
Citation metric windows across 2, 3, and 4 years
Chinese Academy of Sciences (CAS) Classification
Major / minor zone classification and CAS Early Warning List history
Academic Intelligence Overview & Context
ImpaQ AnalysisIEEE Design & Test (abbr: IEEE DES. TEST, ISSN: 2168-2356) is a peer-reviewed international scholarly journal in the field of COMPUTER SCIENCE, published by IEEE Computer Society in United States. The periodical holds a Journal Impact Factor (JIF) of 2.00, ranking in quartile Q3 of Web of Science (SCIE), a Scopus SJR indicator of 0.471 (Q2), an H-index of 89.
The journal enforces rigorous peer evaluation with an annual output of approximately 61 scientific articles. In terms of accessibility and author fees, it operates under the Subscription model with an estimated APC of $2,927 USD. It serves as a benchmark publication platform for academics, researchers, and doctoral candidates seeking global research visibility.
Publishing & Editorial Information
Detailed publisher, peer-review turnaround, and publication cycle specifications
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