IEEE Electron Device Letters
Impact Factor Trend (2018–2026)
Clarivate IF trend for IEEE Electron Device Letters
SCImago Journal Rank citation prestige weighting
184 papers with at least that number of citations each
Aims & Scope
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.
Special Issues
Calls for PapersNo active Calls for Papers found for this journal.
WoS Categories & Quartiles
Detailed JCR / JCI category rankings and quartile breakdown from Clarivate
ENGINEERING, ELECTRICAL & ELECTRONIC
ENGINEERING, ELECTRICAL & ELECTRONIC
Annual Historical Statistics & Publications
Track annual publication volume, total citations, and Impact Factor evolution
SCImago & Scopus Journal Intelligence
Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact
Weighted prestige citation metric per document indexed in the Scopus database.
Average citations received per document published in the 2-year window.
Estimated Article Processing Charge for Open Access publication.
Scopus 3-Year Publication & Citation Window
Aggregated from Scopus database across the 3-year SJR evaluation window.
Societal Impact & Inclusivity (SCImago)
Citations in government and international policy documents
Percentage of female authors published in the journal
Real-world societal policy reach and author gender diversity tracked by SCImago.
Scopus Subject Categories
Journal Metrics & Citation Visualizations
Total Cites vs Self-Cites
Evaluation of scholarly independence and citation reach
Citations per Document
Citation metric windows across 2, 3, and 4 years
Chinese Academy of Sciences (CAS) Classification
Major / minor zone classification and CAS Early Warning List history
Academic Intelligence Overview & Context
ImpaQ AnalysisIEEE Electron Device Letters (acronym: edl, abbr: IEEE ELECTRON DEVICE LETT, ISSN: 0741-3106) is a peer-reviewed international scholarly journal in the field of Engineering & Technology, published by Institute of Electrical and Electronics Engineers Inc. in United States since 1980. The periodical holds a Journal Impact Factor (JIF) of 4.60, ranking in quartile Q2 of Web of Science (SCIE), a Scopus SJR indicator of 1.087 (Q1), an H-index of 184.
The journal enforces rigorous peer evaluation with a publication frequency of Monthly, an annual output of approximately 429 scientific articles. In terms of accessibility and author fees, it operates under the Hybrid model with an estimated APC of $3,436 USD. It serves as a benchmark publication platform for academics, researchers, and doctoral candidates seeking global research visibility.
Publishing & Editorial Information
Detailed publisher, peer-review turnaround, and publication cycle specifications
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