IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Impact Factor Trend (2018–2026)
Clarivate IF trend for IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
SCImago Journal Rank citation prestige weighting
151 papers with at least that number of citations each
Aims & Scope
The IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing addresses the growing field of applications in Earth observations and remote sensing, and also provides a venue for the rapidly expanding special issues that are being sponsored by the IEEE Geosciences and Remote Sensing Society. The journal draws upon the experience of the highly successful “IEEE Transactions on Geoscience and Remote Sensing” and provide a complementary medium for the wide range of topics in applied earth observations. The ‘Applications’ areas encompasses the societal benefit areas of the Global Earth Observations Systems of Systems (GEOSS) program. Through deliberations over two years, ministers from 50 countries agreed to identify nine areas where Earth observation could positively impact the quality of life and health of their respective countries. Some of these are areas not traditionally addressed in the IEEE context. These include biodiversity, health and climate. Yet it is the skill sets of IEEE members, in areas such as observations, communications, computers, signal processing, standards and ocean engineering, that form the technical underpinnings of GEOSS. Thus, the Journal attracts a broad range of interests that serves both present members in new ways and expands the IEEE visibility into new areas.
Special Issues
Calls for PapersNo active Calls for Papers found for this journal.
WoS Categories & Quartiles
Detailed JCR / JCI category rankings and quartile breakdown from Clarivate
ENGINEERING, ELECTRICAL & ELECTRONIC
GEOGRAPHY, PHYSICAL
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY
REMOTE SENSING
ENGINEERING, ELECTRICAL & ELECTRONIC
GEOGRAPHY, PHYSICAL
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY
REMOTE SENSING
Annual Historical Statistics & Publications
Track annual publication volume, total citations, and Impact Factor evolution
SCImago & Scopus Journal Intelligence
Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact
Weighted prestige citation metric per document indexed in the Scopus database.
Average citations received per document published in the 2-year window.
Estimated Article Processing Charge for Open Access publication.
Scopus 3-Year Publication & Citation Window
Aggregated from Scopus database across the 3-year SJR evaluation window.
Societal Impact & Inclusivity (SCImago)
Citations in government and international policy documents
Percentage of female authors published in the journal
Real-world societal policy reach and author gender diversity tracked by SCImago.
Scopus Subject Categories
Journal Metrics & Citation Visualizations
Total Cites vs Self-Cites
Evaluation of scholarly independence and citation reach
Citations per Document
Citation metric windows across 2, 3, and 4 years
Chinese Academy of Sciences (CAS) Classification
Major / minor zone classification and CAS Early Warning List history
Academic Intelligence Overview & Context
ImpaQ AnalysisIEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing (acronym: jstars, abbr: IEEE J. SEL. TOP. APPL. EARTH OBS. REMOTE SENS, ISSN: 1939-1404) is a peer-reviewed international scholarly journal in the field of Geosciences, published by Institute of Electrical and Electronics Engineers Inc. in United States. The periodical holds a Journal Impact Factor (JIF) of 6.30, ranking in quartile Q1 of Web of Science (SCIE), a Scopus SJR indicator of 1.452 (Q1), an H-index of 151.
The journal enforces rigorous peer evaluation with a publication frequency of Quarterly, an annual output of approximately 948 scientific articles. In terms of accessibility and author fees, it operates under the Gold OA model with an estimated APC of $3,527 USD. It serves as a benchmark publication platform for academics, researchers, and doctoral candidates seeking global research visibility.
Publishing & Editorial Information
Detailed publisher, peer-review turnaround, and publication cycle specifications
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