ImpaQ Ecosystem•Clarivate, Scopus & CORE Data
Clarivate WoS 2024 / 2025 Data
IMPAQ
WoS SCIE Q1Scopus Q1SCImago #3,850Hybrid

IEEE Transactions on Reliability

Acronym:tr-ieee
•
Abbreviation (ISO):IEEE TRANS. RELIAB
•
Identifier (ISSN):0018-9529(Print)/1558-1721(Online)
•
Publisher:Institute of Electrical and Electronics Engineers Inc.
Clarivate IF (2026)
5.4↓ -0.3
Journal Impact Factor
IF Trend↓
WoS Quartile
Q1
WoS SCIEJCR Quartile
Clarivate WoS JCR
WoS Categories↓
JCR Release Date: 2026-06-17

Impact Factor Trend (2018–2026)

Clarivate IF trend for IEEE Transactions on Reliability

WoS Q1
13682.7320182.8920193.1820204.4220215.8820225.92023520245.720255.42026
Annual Impact Factor Metric
Current (2026):5.4
Scopus SJR & RankScopus Q1
1.16
#3,850

SCImago Journal Rank citation prestige weighting

Scopus Year: 2025
H-Index (2025)
131

131 papers with at least that number of citations each

WoS: SCIE / JCRQ1
Self-Citation Rate8%
Safe Level (< 15%)Warning Level (> 20%)
Self-citation below 15% indicates strong scholarly independence.
Volume & Open AccessHybrid
177articles/year
3.5% Gold OA•100% Original Research

Aims & Scope

IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.

Topics Covered (Recognized by AI)
Computer science94.7%Engineering85.8%Mathematics81.9%Reliability engineering74.3%Statistics70%Physics56%Psychology54%Failure rate52%Quantum mechanics51.5%Developmental psychology51.3%Reliability theory49.5%Generalizability theory49.5%Thermodynamics45%Power (physics)40.9%Reliability (semiconductor)40%Programming language24.1%Operating system22.3%Algorithm20.4%

WoS Categories & Quartiles

Detailed JCR / JCI category rankings and quartile breakdown from Clarivate

Clarivate JCR & JCI
JCRSCIE2026

COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

Q1
Rank11/60
IndexSCIE
JCRSCIE2026

COMPUTER SCIENCE, SOFTWARE ENGINEERING

Q1
Rank18/128
IndexSCIE
JCRSCIE2026

ENGINEERING, ELECTRICAL & ELECTRONIC

Q1
Rank80/369
IndexSCIE
JCISCIE2026

COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

Q1
Rank7/61
IndexSCIE
JCISCIE2026

COMPUTER SCIENCE, SOFTWARE ENGINEERING

Q1
Rank16/128
IndexSCIE
JCISCIE2026

ENGINEERING, ELECTRICAL & ELECTRONIC

Q1
Rank48/371
IndexSCIE

Annual Historical Statistics & Publications

Track annual publication volume, total citations, and Impact Factor evolution

12 year
2026Latest
IF5.4
Articles / Year170
Total Citations62
2025
IF5.7
Articles / Year201
Total Citations587
2024
IF5
Articles / Year210
Total Citations1,716
2023
IF5.9
Articles / Year159
Total Citations2,201
2022
IF5.883
Articles / Year164
Total Citations4,201

SCImago & Scopus Journal Intelligence

Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact

Rank #3,850Scopus Q1SCImago Profile
Scopus Coverage:1963-2026
Scopus Broad Areas:Engineering
Scopus Citation Rank (SJR)Q1
1.16

Weighted prestige citation metric per document indexed in the Scopus database.

Quartile: Scopus Q1
Citations / Doc (2 years)
7.04

Average citations received per document published in the 2-year window.

2-Year Citation Window
Estimated Publication Fee (APC)
$3,493 USD

Estimated Article Processing Charge for Open Access publication.

Estimated cost / article

Scopus 3-Year Publication & Citation Window

3-Year Citations2,891
3-Year Documents412
Citable Documents404

Aggregated from Scopus database across the 3-year SJR evaluation window.

Societal Impact & Inclusivity (SCImago)

Policy Citations (Overton)0

Citations in government and international policy documents

Female Author Rate29.1%

Percentage of female authors published in the journal

Real-world societal policy reach and author gender diversity tracked by SCImago.

Scopus Subject Categories

Electrical and Electronic EngineeringQ1
Safety, Risk, Reliability and QualityQ1
Academic Metric Intelligence

Journal Metrics & Citation Visualizations

Total Cites vs Self-Cites

Evaluation of scholarly independence and citation reach

Total citations steady growth
Self-citation: 8%

Citations per Document

Citation metric windows across 2, 3, and 4 years

Cites / Doc (4 years)Cites / Doc (3 years)Cites / Doc (2 years)

Chinese Academy of Sciences (CAS) Classification

Major / minor zone classification and CAS Early Warning List history

Major Category (Broad Field):
2区 (Zone 2)Computer Science
Minor Category (Specific Field):
1区COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
CAS Early Warning List History:
Updated annually: 2020 – 2024
2020
Not warned
2021
Not warned
2022
Not warned
2023
Not warned
2024
Not warned

Academic Intelligence Overview & Context

ImpaQ Analysis

IEEE Transactions on Reliability (acronym: tr-ieee, abbr: IEEE TRANS. RELIAB, ISSN: 0018-9529) is a peer-reviewed international scholarly journal in the field of Engineering & Technology, published by Institute of Electrical and Electronics Engineers Inc. in United States. The periodical holds a Journal Impact Factor (JIF) of 5.40, ranking in quartile Q1 of Web of Science (SCIE), a Scopus SJR indicator of 1.160 (Q1), an H-index of 131.

The journal enforces rigorous peer evaluation with a publication frequency of Quarterly, an annual output of approximately 177 scientific articles. In terms of accessibility and author fees, it operates under the Hybrid model with an estimated APC of $3,493 USD. It serves as a benchmark publication platform for academics, researchers, and doctoral candidates seeking global research visibility.

Publishing & Editorial Information

Detailed publisher, peer-review turnaround, and publication cycle specifications

Open Access Model
Hybrid
Publisher
Institute of Electrical and Electronics Engineers Inc.
Publication Language
English
Frequency
Quarterly
Indexing & Databases
SCIEScopusPubMed
Editorial Address
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141

Similar Journals in Discipline

Journals in the same research field with comparable impact metrics

Record UUID: 9d18395e-e3e8-472a-8a14-f8636be23f9a
Database Updated: 2026-10-01