What is the Impact Factor of Journal of Nanoelectronics and Optoelectronics?

According to the latest Clarivate Journal Citation Reports (JCR), the Journal Impact Factor of Journal of Nanoelectronics and Optoelectronics is 0.60, ranking in quartile Q4 of Web of Science (SCIE).

Is Journal of Nanoelectronics and Optoelectronics indexed in Web of Science or Scopus?

Yes, Journal of Nanoelectronics and Optoelectronics is indexed in Web of Science (SCIE, Q4 quartile). Furthermore, in Scopus (SCImago), it holds an SJR rating of N/A (Q4) and an H-index of 18.

Who publishes Journal of Nanoelectronics and Optoelectronics and what is the Article Processing Charge (APC)?

Journal of Nanoelectronics and Optoelectronics is published by AMER SCIENTIFIC PUBLISHERS. For exact article processing charges and subscription guidelines, consult the official editorial guidelines.

What is the ISO-4 abbreviation and acronym of Journal of Nanoelectronics and Optoelectronics?

The official ISO-4 abbreviation of Journal of Nanoelectronics and Optoelectronics is "J. Nanoelectron. Optoelectron". This standardized title abbreviation is used in citation lists conforming to IEEE, APA, Harvard, or Vancouver styles.

WoS SCIE Q4Subscription

Journal of Nanoelectronics and Optoelectronics

Abbreviation (ISO):J. Nanoelectron. Optoelectron

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Identifier (ISSN):1555-130X(Print / Online)

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Publisher:AMER SCIENTIFIC PUBLISHERS

Official Website Submission Portal Compare

Clarivate IF (2026)

0.6↑ +0.1

Journal Impact Factor

IF Trend↓

WoS Quartile

WoS SCIEJCR Quartile

Clarivate WoS JCR

WoS Categories↓

JCR Release Date: 2026-06-17

Impact Factor Trend (2018–2026)

Clarivate IF trend for Journal of Nanoelectronics and Optoelectronics

WoS Q4

Annual Impact Factor Metric

Current (2026):0.6

Scopus SJR & Rank

N/A

SCImago Journal Rank citation prestige weighting

Scopus / Elsevier Data

H-Index (2021)

18 papers with at least that number of citations each

WoS: SCIE / JCRQ4

Self-Citation Rate33.3%

Safe Level (< 15%)Warning Level (> 20%)

Self-citation below 15% indicates strong scholarly independence.

Volume & Open AccessSubscription

243articles/year

0% Gold OA•99.49% Original Research

Aims & Scope

Journal of Nanoelectronics and Optoelectronics (abbr: J. Nanoelectron. Optoelectron, ISSN: 1555-130X) is a peer-reviewed international scholarly journal in the field of Engineering & Technology, published by AMER SCIENTIFIC PUBLISHERS in United States since 2006. The periodical holds a Journal Impact Factor (JIF) of 0.60, ranking in quartile Q4 of Web of Science (SCIE), an H-index of 18.

Topics Covered (Recognized by AI)

Physics91.2%Materials science88.9%Quantum mechanics82.8%Engineering81.4%Chemistry61.6%Optoelectronics57.9%Nanotechnology52.5%Organic chemistry51.5%Electrical engineering46.3%Composite material44.8%Chemical engineering39.8%Computer science38.1%Optics36.1%Biology32.6%Metallurgy30.8%Mathematics24.1%Thermodynamics22.9%Condensed matter physics21.7%

Primary Research Areas

Engineering & Technology Engineering: Electrical & Electronic

Official Website NLM PubMed Catalog Submission Portal

0 calls

Special Issues

Calls for Papers

No active Calls for Papers found for this journal.

Expand

WoS Categories & Quartiles

Detailed JCR / JCI category rankings and quartile breakdown from Clarivate

Clarivate JCR & JCI

JCRSCIE2026

ENGINEERING, ELECTRICAL & ELECTRONIC

Rank350/369

IndexSCIE

JCRSCIE2026

NANOSCIENCE & NANOTECHNOLOGY

Rank143/148

IndexSCIE

JCRSCIE2026

PHYSICS, APPLIED

Rank184/191

IndexSCIE

JCISCIE2026

ENGINEERING, ELECTRICAL & ELECTRONIC

Rank354/371

IndexSCIE

JCISCIE2026

NANOSCIENCE & NANOTECHNOLOGY

Rank142/148

IndexSCIE

JCISCIE2026

PHYSICS, APPLIED

Rank183/191

IndexSCIE

Category	Index	Rank	Quartile
ENGINEERING, ELECTRICAL & ELECTRONIC	JCRSCIE	350/369	Q4
NANOSCIENCE & NANOTECHNOLOGY	JCRSCIE	143/148	Q4
PHYSICS, APPLIED	JCRSCIE	184/191	Q4
ENGINEERING, ELECTRICAL & ELECTRONIC	JCISCIE	354/371	Q4
NANOSCIENCE & NANOTECHNOLOGY	JCISCIE	142/148	Q4
PHYSICS, APPLIED	JCISCIE	183/191	Q4

Annual Historical Statistics & Publications

Track annual publication volume, total citations, and Impact Factor evolution

12 year

2026Latest

IF0.6

Articles / Year19

Total Citations0

2025

IF0.5

Articles / Year152

Total Citations89

2024

IF0.6

Articles / Year160

Total Citations247

2023

IF0.6

Articles / Year179

Total Citations359

2022

IF0.697

Articles / Year195

Total Citations363

Year	Impact Factor	Articles / Year	Total Citations
2026	0.6	19	0
2025	0.5	152	89
2024	0.6	160	247
2023	0.6	179	359
2022	0.697	195	363
2021	0.961	264	640
2020	0.771	153	452
2019	0.989	227	1,093
2018	1.069	262	1,052
2017	—	189	680
2016	—	124	778
2015	—	225	737

SCImago & Scopus Journal Intelligence

Not indexed in SCImago / Scopus database

This journal is currently not indexed in Scopus or is an academic publication indexed exclusively in Web of Science (WoS).

Academic Metric Intelligence

Journal Metrics & Citation Visualizations

Total Cites vs Self-Cites

Evaluation of scholarly independence and citation reach

Total citations steady growth

Self-citation: 33.3%

Citations per Document

Citation metric windows across 2, 3, and 4 years

Cites / Doc (4 years)Cites / Doc (3 years)Cites / Doc (2 years)

Chinese Academy of Sciences (CAS) Classification

Major / minor zone classification and CAS Early Warning List history

Major Category (Broad Field):

4区 (Zone 4)Engineering & Technology

Minor Category (Specific Field):

4区ENGINEERING, ELECTRICAL & ELECTRONIC

CAS Early Warning List History:

Updated annually: 2020 – 2024

2020

Not warned

2021

Not warned

2022

Not warned

2023

Not warned

2024

In warning list

Academic Intelligence Overview & Context

ImpaQ Analysis

The journal enforces rigorous peer evaluation with a publication frequency of Tri-annual, an annual output of approximately 243 scientific articles. In terms of accessibility and author fees, it operates under the Subscription model with APC fees are not specified. It serves as a benchmark publication platform for academics, researchers, and doctoral candidates seeking global research visibility.