Russian Microelectronics
Impact Factor Trend
Clarivate IF trend for Russian Microelectronics
SCImago Journal Rank citation prestige weighting
21 papers with at least that number of citations each
Aims & Scope
Russian Microelectronics covers physical, technological, and some VLSI and ULSI circuit-technical aspects of microelectronics and nanoelectronics; it informs the reader of new trends in submicron optical, x-ray, electron, and ion-beam lithography technology; dry processing techniques, etching, doping; and deposition and planarization technology. Significant space is devoted to problems arising in the application of proton, electron, and ion beams, plasma, etc. Consideration is given to new equipment, including cluster tools and control in situ and submicron CMOS, bipolar, and BICMOS technologies. The journal publishes papers addressing problems of molecular beam epitaxy and related processes; heterojunction devices and integrated circuits; the technology and devices of nanoelectronics; and the fabrication of nanometer scale devices, including new device structures, quantum-effect devices, and superconducting devices. The reader will find papers containing news of the diagnostics of surfaces and microelectronic structures, the modeling of technological processes and devices in micro- and nanoelectronics, including nanotransistors, and solid state qubits.
Special Issues
Calls for PapersNo active Calls for Papers found for this journal.
WoS Categories & Quartiles
Detailed JCR / JCI category rankings and quartile breakdown from Clarivate
No WoS category details available for this journal.
Annual Historical Statistics & Publications
Track annual publication volume, total citations, and Impact Factor evolution
SCImago & Scopus Journal Intelligence
Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact
Weighted prestige citation metric per document indexed in the Scopus database.
Average citations received per document published in the 2-year window.
Estimated Article Processing Charge for Open Access publication.
Scopus 3-Year Publication & Citation Window
Aggregated from Scopus database across the 3-year SJR evaluation window.
Societal Impact & Inclusivity (SCImago)
Citations in government and international policy documents
Percentage of female authors published in the journal
Real-world societal policy reach and author gender diversity tracked by SCImago.
Scopus Subject Categories
Journal Metrics & Citation Visualizations
Total Cites vs Self-Cites
Evaluation of scholarly independence and citation reach
Citations per Document
Citation metric windows across 2, 3, and 4 years
Chinese Academy of Sciences (CAS) Classification
Major / minor zone classification and CAS Early Warning List history
Academic Intelligence Overview & Context
ImpaQ AnalysisRussian Microelectronics (ISSN: 1063-7397) is a peer-reviewed international scholarly journal in the field of Materials Science, published by Pleiades Publishing in Russian Federation. The periodical holds tracked under Web of Science (SCIE) in quartile Q1, a Scopus SJR indicator of 0.156 (Q4), an H-index of 21.
The journal enforces rigorous peer evaluation with a publication frequency of 8 issues per year, an annual output of approximately 23 scientific articles. In terms of accessibility and author fees, it operates under the Subscription model with an estimated APC of $2,458 USD. It serves as a benchmark publication platform for academics, researchers, and doctoral candidates seeking global research visibility.
Publishing & Editorial Information
Detailed publisher, peer-review turnaround, and publication cycle specifications
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