Microelectronics Reliability
Impact Factor Trend (2018–2026)
Clarivate IF trend for Microelectronics Reliability
SCImago Journal Rank citation prestige weighting
115 papers with at least that number of citations each
Aims & Scope
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
Special Issues
Calls for Papers1 Calls for Papers · Automatically synced from ScienceDirect & publishers
WoS Categories & Quartiles
Detailed JCR / JCI category rankings and quartile breakdown from Clarivate
ENGINEERING, ELECTRICAL & ELECTRONIC
NANOSCIENCE & NANOTECHNOLOGY
PHYSICS, APPLIED
ENGINEERING, ELECTRICAL & ELECTRONIC
NANOSCIENCE & NANOTECHNOLOGY
PHYSICS, APPLIED
Annual Historical Statistics & Publications
Track annual publication volume, total citations, and Impact Factor evolution
SCImago & Scopus Journal Intelligence
Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact
Weighted prestige citation metric per document indexed in the Scopus database.
Average citations received per document published in the 2-year window.
Estimated Article Processing Charge for Open Access publication.
Scopus 3-Year Publication & Citation Window
Aggregated from Scopus database across the 3-year SJR evaluation window.
Societal Impact & Inclusivity (SCImago)
Citations in government and international policy documents
Percentage of female authors published in the journal
Real-world societal policy reach and author gender diversity tracked by SCImago.
Scopus Subject Categories
Journal Metrics & Citation Visualizations
Total Cites vs Self-Cites
Evaluation of scholarly independence and citation reach
Citations per Document
Citation metric windows across 2, 3, and 4 years
Chinese Academy of Sciences (CAS) Classification
Major / minor zone classification and CAS Early Warning List history
Academic Intelligence Overview & Context
ImpaQ AnalysisMicroelectronics Reliability (acronym: micrel, abbr: Microelectron. Reliab, ISSN: 0026-2714) is a peer-reviewed international scholarly journal in the field of Engineering & Technology, published by Elsevier Ltd in England since 1964. The periodical holds a Journal Impact Factor (JIF) of 2.50, ranking in quartile Q3 of Web of Science (SCIE), a Scopus SJR indicator of 0.464 (Q2), an H-index of 115.
The journal enforces rigorous peer evaluation with an average review speed of 8.3周, a publication frequency of Monthly, an annual output of approximately 355 scientific articles. In terms of accessibility and author fees, it operates under the Hybrid model with an estimated APC of $2,840 USD. It serves as a benchmark publication platform for academics, researchers, and doctoral candidates seeking global research visibility.
Publishing & Editorial Information
Detailed publisher, peer-review turnaround, and publication cycle specifications
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